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CVE-2024-45573

Use of Out-of-range Pointer Offset in Display PUBLISHED

Description (CNA)

Memory corruption may occour while generating test pattern due to negative indexing of display ID.

Affected (CNA)

Vendor / productVersions
Qualcomm, Inc. / Snapdragonaffected FastConnect 6700; affected FastConnect 6900; affected FastConnect 7800; affected QCM5430; affected QCM6490; affected QCS5430; affected QCS6490; affected Qualcomm Video Collaboration VC3 Platform; affected SC8380XP; affected SDM429W; affected Snapdragon 429 Mobile Platform; affected Snapdragon 7c+ Gen 3 Compute; affected Snapdragon 8cx Gen 3 Compute Platform (SC8280XP-AB, BB); affected WCD9370; affected WCD9375; affected WCD9380; affected WCD9385; affected WCN3620; affected WCN3660B; affected WSA8830; affected WSA8835; affected WSA8840; affected WSA8845; affected WSA8845H

CWE

CWE-823

References

ADP enrichment

CISA-ADP

No English description supplied.

No references supplied.