CVE-2024-53017

Use of Out-of-range Pointer Offset in Camera Driver PUBLISHED

Description (CNA)

Memory corruption while handling test pattern generator IOCTL command.

Vendor / product	Versions
Qualcomm, Inc. / Snapdragon	affected SDM429W; affected Snapdragon 429 Mobile Platform; affected WCN3620; affected WCN3660B

CWE-823

CISA-ADP

No English description supplied.

No references supplied.