Description (CNA)
Memory corruption occurs when handling client calls to EnableTestMode through an Escape call.
Affected (CNA)
| Vendor / product | Versions |
|---|---|
| Qualcomm, Inc. / Snapdragon | affected AQT1000; affected FastConnect 6200; affected FastConnect 6700; affected FastConnect 6800; affected FastConnect 6900; affected FastConnect 7800; affected QCA6391; affected QCA6420; affected QCA6430; affected QCM5430; affected QCM6490; affected QCS5430; affected QCS6490; affected Qualcomm Video Collaboration VC3 Platform; affected SC8180X+SDX55; affected SC8380XP; affected SM6250; affected Snapdragon 7c Compute Platform (SC7180-AC); affected Snapdragon 7c Gen 2 Compute Platform (SC7180-AD) "Rennell Pro"; affected Snapdragon 7c+ Gen 3 Compute; affected Snapdragon 8c Compute Platform (SC8180X-AD) "Poipu Lite"; affected Snapdragon 8c Compute Platform (SC8180XP-AD) "Poipu Lite"; affected Snapdragon 8cx Compute Platform (SC8180X-AA, AB); affected Snapdragon 8cx Compute Platform (SC8180XP-AC, AF) "Poipu Pro"; affected Snapdragon 8cx Gen 2 5G Compute Platform (SC8180X-AC, AF) "Poipu Pro"; affected Snapdragon 8cx Gen 2 5G Compute Platform (SC8180XP-AA, AB); affected Snapdragon 8cx Gen 3 Compute Platform (SC8280XP-AB, BB); affected WCD9340; affected WCD9341; affected WCD9370; affected WCD9375; affected WCD9380; affected WCD9385; affected WSA8810; affected WSA8815; affected WSA8830; affected WSA8835; affected WSA8840; affected WSA8845; affected WSA8845H |
CWE
CWE-129
References
ADP enrichment
No English description supplied.
No references supplied.